Vibrational lifetimes of hydrogen in silicon

被引：0
作者：
Sun, B [1 ]
Lüpke, G
Tolk, NH
Feldman, LC
机构：
[1] Coll William & Mary, Dept Appl Sci, Williamsburg, VA 23187 USA
[2] Vanderbilt Univ, Dept Phys & Astron, Nashville, TN 37235 USA
来源：
HYDROGEN IN MATERIALS AND VACUUM SYSTEMS | 2003年 / 671卷
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D O I：
暂无
中图分类号：
O61 [无机化学];
学科分类号：
070301 ; 081704 ;
摘要：
We have measured the frequency shift of the 817 cm(-1) bend mode of H-2(.) as a function of temperature by infrared absorption spectroscopy. The phase relaxation of the bend mode is dominated by low energy excitation of 270 +/- 9 cm(-1) modes. Further lifetime measurements by transient bleaching spectroscopy are necessary to elucidate the decay mechanism.
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页码：67 / 73
页数：7
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