Negative Thermal Expansion in Ba0.5Sr0.5Zn2SiGeO7

被引:13
作者
Thieme, Christian [1 ]
Ruessel, Christian [1 ]
机构
[1] Univ Jena, Otto Schott Inst Mat Forsch, Fraunhoferstr 6, D-07743 Jena, Germany
来源
MATERIALS | 2016年 / 9卷 / 08期
关键词
X-ray diffraction; negative thermal expansion; phase transition;
D O I
10.3390/ma9080631
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Solid solutions with the composition Ba0.5Sr0.5Zn2Si2-xGexO7 and BaZn2Si2-xGexO7 were prepared with different values of x using a conventional mixed oxide route. Both compounds exhibit very different thermal expansion, which is due to the different crystal structures. Ba0.5Sr0.5Zn2Si2-xGexO7 solid solutions exhibit the structure of high-temperature BaZn2Si2O7 and show negative thermal expansion, which was proven via high-temperature X-ray diffraction. Up to around x = 1, the crystal structure remains the same. Above this value, the low-temperature phase becomes stable. The Sr-free solid solutions have the crystal structure of low-temperature BaZn2Si2O7 and show also a limited solubility of Ge. These Sr-free compositions show transitions of low-to high-temperature phases, which are shifted to higher temperatures with increasing Ge-concentration.
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页数:5
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