Optical Constant and Thickness Determination Using THz Time-Domain Reflection-Only Signals

被引：0

作者：

Haffar, Salah ^{[1
]}

Hasar, Ugur Cem ^{[1
]}

Barroso, Joaquim Jose ^{[2
]}

机构：

[1] Gaziantep Univ, Electr & Electron Engn Dept, TR-27310 Gaziantep, Turkey

[2] Inst Tecnol Aeronaut, BR-12242680 Sao Jose Dos Campos, SP, Brazil

来源：

2017 SBMO/IEEE MTT-S INTERNATIONAL MICROWAVE AND OPTOELECTRONICS CONFERENCE (IMOC) | 2017年

关键词：

Terahertz; optical constants; calibration-free; reflection-only; time-domain; DIELECTRIC-PROPERTIES; TERAHERTZ; SPECTROSCOPY; ABSORPTION;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A self-calibration noniterative technique for determination of the optical constants and thickness of lossless materials using only three reflection measurements is proposed. A generalized model is derived based on the reflection measurements. For validation, two different samples (Si and GaAs samples) are considered for extraction of their optical parameters and thicknesses by using a numerical full wave electromagnetic simulator. It is demonstrated that the proposed method can retrieve highly accurate results provided that reflected signal components are accurately separated.

引用

页数：5

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