Incipient Fault Detection of Nonlinear Processes Based on Probablility Related SVDD in Local Variable Field

被引:0
作者
Wang, Xiaohui [1 ,2 ]
Wang, Yanjiang [1 ]
Deng, Xiaogang [1 ]
Cao, Yuping [1 ]
机构
[1] China Univ Petr East China, Coll Control Sci & Engn, Qingdao, Peoples R China
[2] Qingdao Univ, Coll Appl Technol, Qingdao, Peoples R China
来源
2020 CHINESE AUTOMATION CONGRESS (CAC 2020) | 2020年
关键词
incipient fault detection; support vector data description; multi-block; Kullback Leibler divergence; DATA-DRIVEN; DIAGNOSIS;
D O I
10.1109/CAC51589.2020.9327099
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Support vector data description (SVDD) is an effective algorithm for nonlinear process monitoring. However, the conventional SVDD method can't deal with the incipient faults well, which has the small fault amplitude and is easy to be overlapped by industrial noises. Aiming at this problem, an improved SVDD, called probability related SVDD in local variable field (LVPSVDD), is proposed to detect the incipient faults in nonlinear processes. Firstly, the method divides process variables into several local variable fields by hierarchical clustering, and the SVDD model of each variable field is built. Then the sliding window technology is applied to the SVDD distance statistics, and the probability distribution change in the sliding window is measured by Kullback Leibler divergence (KLD). For each local variable field, the corresponding probability related monitoring statistic is developed to replace the original distance statistic. Finally, the global monitoring statistic is obtained by integrating the monitoring results of all local variable fields with Bayesian inference strategy. The method is illustrated with simulation on the continuous stirred tank reactor (CSTR).
引用
收藏
页码:3732 / 3737
页数:6
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