Formal Verification of Tunnel Diode Oscillator with Temperature Variations

被引：0
|
作者：
Lata, Kusum [1 ]
Jamadagni, H. S. [1 ]
机构：
[1] Indian Inst Sci, Ctr Elect Design & Technol, Bangalore 560012, Karnataka, India
来源：
2010 15TH ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE (ASP-DAC 2010) | 2010年
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D O I：
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中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
In this paper, we propose an extension to the formal verification approach of hybrid systems to verify the Tunnel Diode Oscillator (TDO) with temperature variations. This enables the same platform that is used for validating the hybrid system, to be also used to formally verify the Tunnel Diode Oscillator with temperature variations. The proposed approach utilizes the simulation traces from the actual implementation of the analog circuits to carry out the formal analysis and verification. We demonstrate our approach around Checkmate [1] and Tunnel diode Oscillator (TDO) as a case study. Current-Voltage simulations were performed on a tunnel diode and the basic feature of the I-V characteristics were analyzed in the temperature range 100-300K. TDO is designed and validated based on these characteristics. In particular, TDO has been verified formally for the continuous range of initial conditions at this temperature range.
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页码：214 / 219
页数：6
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