RF and mechanical characterization of flip-chip interconnects in CPW circuits with underfill

被引:45
作者
Feng, ZP [1 ]
Zhang, WG [1 ]
Su, BZ [1 ]
Gupta, KC [1 ]
Lee, YC [1 ]
机构
[1] Univ Colorado, NSF, Ctr Adv Mfg & Packaging Microwave Opt & Digital E, Boulder, CO 80309 USA
关键词
CPW circuits; flip-chip; mechanical characterization; RF characterization;
D O I
10.1109/22.739210
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
RF characterization of flip-chip interconnects in coplanar waveguide (CPW) circuits with underfill is reported. The scattering-parameters have been measured up to 40 GHz for GaAs CPW through-line chips flip-chip mounted on an alumina substrate with and without an underfill epoxy, A lumped-element model of flip-chip interconnect has been developed for flip-chip assemblies with and without epoxy, Fatigue life of flip-chip assemblies has been computed for different chip sizes and substrates. The results show feasibility of using underfill encapsulant in microwave/millimeter-wave frequency range.
引用
收藏
页码:2269 / 2275
页数:7
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