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3D computed tomography using a microfocus X-ray source: Analysis of artifact formation in the reconstructed images using simulated as well as experimental projection data
被引:18
|作者:
Krimmel, S
Stephan, J
Baumann, J
机构:
[1] Tech Univ Munich, Phys Dept E21, D-85748 Garching, Germany
[2] Siemens AG, Corp Technol, D-81730 Munich, Germany
来源:
关键词:
tomography;
feldkamp;
simulation;
X-ray;
nondestructive testing;
artifacts;
D O I:
10.1016/j.nima.2005.01.171
中图分类号:
TH7 [仪器、仪表];
学科分类号:
0804 ;
080401 ;
081102 ;
摘要:
The scope of this contribution is to identify and to quantify the influence of different parameters on the formation of image artifacts in X-ray computed tomography (CT) resulting for example, from beam hardening or from partial lack of information using 3D cone beam CT. In general, the reconstructed image quality depends on a number of acquisition parameters concerning the X-ray source (e.g. X-ray spectrum), the geometrical setup (e.g. cone beam angle), the sample properties (e.g. absorption characteristics) and the detector properties. While it is difficult to distinguish the influence of different effects clearly in experimental projection data, they can be selected individually with the help of simulated projection data by varying the parameter set. The reconstruction of the 3D data set is performed with the filtered back projection algorithm according to Feldkamp, Davis and Kress for experimental as well as for simulated projection data. The experimental data are recorded with an industrial microfocus CT system which features a focal spot size of a few micrometers and uses a digital flat panel detector for data acquisition. (c) 2005 Elsevier B.V. All rights reserved.
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页码:399 / 407
页数:9
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