Theoretical and experimental sensitivity to X-rays of single and polycrystalline HgI2 compared with different single-crystal detectors

被引：44
作者：
Schieber, M [1 ]
Hermon, H
Zuck, A
Vilensky, A
Melekhov, L
Shatunovsky, R
Meerson, E
Saado, H
机构：
[1] Hebrew Univ Jerusalem, Grad Sch Appl Sci, IL-91904 Jerusalem, Israel
[2] Real Time Radiog Readout, IL-91487 Jerusalem, Israel
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2001年 / 458卷 / 1-2期
关键词：
imaging; X-ray; polycrystalline; mercuric iodide; current mode detector;
D O I：
10.1016/S0168-9002(00)00849-4
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The response for medical X-ray generator of single and polycrystalline HgI2 to 65 kVp X-rays has been compared to the response of single-crystal CdZnTe and PbI2 detectors using the current integration mode. The dark current density expressed in pA/mm(2) and sensitivity expressed in muC/R x cm(2) are given for these detectors for several thicknesses. The polycrystalline HgI2 thick film detectors were fabricated using the hot wall physical vapor-phase deposition (PVD) method. (C) 2001 Elsevier Science B.V. All rights reserved.
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页码：41 / 46
页数：6
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