Resolution Enhancement Method Used for Force Sensing Resistor Array

被引:10
作者
De Jesus, Karen Flores [1 ]
Cheng, Marvin H. [1 ]
Jiang, Lei [1 ]
Bakhoum, Ezzat G. [2 ]
机构
[1] W Virginia Univ, Dept Mech & Aerosp Engn, Morgantown, WV 26505 USA
[2] Univ W Florida, Dept Elect & Comp Engn, Pensacola, FL 32514 USA
关键词
SUPERRESOLUTION;
D O I
10.1155/2015/647427
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Tactile sensors are one of the major devices that enable robotic systems to interact with the surrounding environment. This research aims to propose a mathematical model to describe the behavior of a tactile sensor based on experimental and statistical analyses and moreover to develop a versatile algorithm that can be applied to different tactile sensor arrays to enhance the limited resolution. With the proposed algorithm, the resolution can be increased up to twenty times if multiple measurements are available. To verify if the proposed algorithm can be used for tactile sensor arrays that are used in robotic system, a 16 x 10 force sensing array (FSR) is adopted. The acquired two-dimensional measurements were processed by a resolution enhancement method (REM) to enhance the resolution, which can be used to improve the resolution for single image or multiple measurements. As a result, the resolution of the sensor is increased and it can be used as synthetic skin to identify accurate shapes of objects and applied forces.
引用
收藏
页数:12
相关论文
共 16 条
[1]  
[Anonymous], 2013, FSR 101 THE BASICS
[2]   Limits on super-resolution and how to break them [J].
Baker, S ;
Kanade, T .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 2002, 24 (09) :1167-1183
[3]   ITERATIVE METHODS FOR IMAGE DEBLURRING [J].
BIEMOND, J ;
LAGENDIJK, RL ;
MERSEREAU, RM .
PROCEEDINGS OF THE IEEE, 1990, 78 (05) :856-883
[4]   EXACT MAXIMUM-LIKELIHOOD PARAMETER-ESTIMATION OF SUPERIMPOSED EXPONENTIAL SIGNALS IN NOISE [J].
BRESLER, Y ;
MACOVSKI, A .
IEEE TRANSACTIONS ON ACOUSTICS SPEECH AND SIGNAL PROCESSING, 1986, 34 (05) :1081-1089
[5]  
Cheng M. H., MEASUREMENT IN PRESS
[6]  
Chu J., 2009, P 9 INT C SIGN PROC, P1027
[7]  
El-Khamy S. E., 2008, Progress In Electromagnetics Research B, V7, P13, DOI 10.2528/PIERB08020404
[8]  
Freeman W. T., 2002, IEEE COMPUT GRAPH, V22, P56
[9]   MULTIVARIATE ADAPTIVE REGRESSION SPLINES [J].
FRIEDMAN, JH .
ANNALS OF STATISTICS, 1991, 19 (01) :1-67
[10]   Statistical pattern recognition: A review [J].
Jain, AK ;
Duin, RPW ;
Mao, JC .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 2000, 22 (01) :4-37