XAFS in the high-energy region

被引:15
作者
Nishihata, Y [1 ]
Kamishima, O
Kubozono, Y
Maeda, H
Emura, S
机构
[1] RIKEN, JAERI, SPring Project Team 8, Kamigori, Hyogo 67812, Japan
[2] Okayama Univ, Fac Sci, Okayama 700, Japan
[3] Osaka Univ, Inst Sci & Ind Res, Ibaraki, Osaka 567, Japan
关键词
X-ray absorption fine-structure (XAFS); extended X-ray fine-structure (EXAFS); structure parameters;
D O I
10.1107/S0909049597016749
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
XAFS (X-ray absorption fine-structure) spectra were measured near K-absorption edges of Ce (40.5 keV), Dy (53.8 keV), Ta (67.4 keV and Pt (78.4 keV). The blunt K-edge jump due to the finite lifetime of the core hole was observed. This makes it difficult to extract EXAFS (extended X-ray absorption fine-structure) functions at low k values. Local structure parameters can be evaluated from the EXAFS spectra above K-absorption edges in the high-energy region as well as from those above L-III-edges. It was found that the finite-lifetime effect of the core hole is effectively taken into the photoelectron mean-free-path term, as predicted theoretically.
引用
收藏
页码:1007 / 1009
页数:3
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