High Thermal Stability of Phosphor-Converted White Light-Emitting Diodes Employing Ce:YAG-Doped Glass

被引:68
作者
Wang, Jimmy [1 ]
Tsai, Chun-Chin [1 ]
Cheng, Wei-Chih [2 ]
Chen, Ming-Hung [1 ]
Chung, Cheng-Hsun [1 ]
Cheng, Wood-Hi [1 ]
机构
[1] Natl Sun Yat Sen Univ, Dept Photon, Kaohsiung 80424, Taiwan
[2] Natl Kaohsiung First Univ Sci & Technol, Kaohsiung 80424, Taiwan
关键词
Aging test; Ce:YAG-doped glass (CeYDG); Ce:YAG-doped silicone (CeYDS); high-power LED modules; phosphor-converted white light-emitting diodes (PC-WLEDs); reliability; IRRADIANCE FORMATIONS; MECHANISMS;
D O I
10.1109/JSTQE.2010.2096459
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
High thermal stability of phosphor-converted white light-emitting diodes (PC-WLEDs) using Ce:YAG-doped glass (CeYDG), instead of conventional Ce: YAG-doped silicone (CeYDS), as a PC layer is proposed and fabricated. The proposed CeYDG possesses host stability as glass and retains desired fluorescence as Ce:YAG. The CeYDG employed in the PC-WLED test demonstrates better performances than conventional CeYDS, including lumen loss, chromaticity shift, transmittance loss, and peak emission intensity undergoing three industry-standard reliability tests at either high (8 wt%) or low (2 wt%) doping concentrations of Ce:YAG. While the CeYDG reveals better stability than the CeYDS, we expect even better performance after refining the glass composition and fabrication process for CeYDG due to current processing facility limitations. However, this study clearly demonstrates the feasibility and advantages of adapting glass as a PC layer in PC-WLED modules that can potentially provide higher reliability and better performance for high-end LEDs, particularly in the area where strict reliability is highly required and in the environment where silicone fails to stand for long.
引用
收藏
页码:741 / 746
页数:6
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