Formation and passivation of defects in heterostructures with strained GaAs/InGaAs quantum wells as a result of treatment in a hydrogen plasma

被引:8
作者
Karpovich, IA [1 ]
Anshon, AV [1 ]
Filatov, DO [1 ]
机构
[1] NI Lobachevskii State Univ, Nizhnii Novgorod 603600, Russia
关键词
D O I
10.1134/1.1187528
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The effect of processing heterostructures with GaAs/InGaAs quantum wells in the hydrogen plasma of an rf glow discharge on the photoluminescence spectrum and capacitive photovoltage of these structures is investigated. It is shown that strained quantum-well heterolayers hinder the diffusion of hydrogen and defects into the bulk, which causes the spatial distributions of recombination-active and passivated hydrogenic defect-like complexes in heterostructures, and the processes that create them, to differ appreciably from the same processes in uniform layers. (C) 1998 American Institute of Physics. [S1063-7826(98)01609-3].
引用
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页码:975 / 979
页数:5
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