Review of night vision metrology

被引：11

作者：

Chrzanowski, K. ^{[1
,2
]}

机构：

[1] INFRAMET, PL-05082 Kwirynow, Stare Babice, Poland

[2] Mil Univ Technol, PL-00908 Warsaw, Poland

来源：

OPTO-ELECTRONICS REVIEW | 2015年 / 23卷 / 02期

关键词：

metrology; night vision;

D O I：

10.1515/oere-2015-0024

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A review of night vision metrology is presented in this paper. A set of reasons that create a rather chaotic metrologic situation on night vision market is presented. It is shown that there has been made a little progress in night vision metrology during last decades in spite of a big progress in night vision technology at the same period of time. It is concluded that such a big discrepancy between metrology development level and technology development can be an obstacle in the further development of night vision technology.

引用

页码：149 / 164

页数：16