Imaging the potential distribution of individual charged impurities on graphene by low-energy electron holography

被引:11
作者
Latychevskaia, Tatiana [1 ]
Wicki, Flavio [1 ]
Escher, Conrad [1 ]
Fink, Hans-Werner [1 ]
机构
[1] Univ Zurich, Phys Dept, Winterthurerstr 190, CH-8057 Zurich, Switzerland
关键词
Electron holography; In-line holography; Gabor holography; Low-energy electrons; Graphene; Charged impurities; IN-LINE HOLOGRAMS; CRYSTALS; FUNCTIONALIZATION; RECONSTRUCTION; OBJECTS;
D O I
10.1016/j.ultramic.2017.07.019
中图分类号
TH742 [显微镜];
学科分类号
摘要
While imaging individual atoms can routinely be achieved in high resolution transmission electron microscopy, visualizing the potential distribution of individually charged adsorbates leading to a phase shift of the probing electron wave is still a challenging task. Low-energy electrons (30-250 eV) are sensitive to localized potential gradients. We employed low-energy electron holography to acquire in-line holograms of individual charged impurities on free-standing graphene. By applying an iterative phase retrieval reconstruction routine we recover the potential distribution of the localized charged impurities present on free-standing graphene. (C) 2017 Elsevier B.V. All rights reserved.
引用
收藏
页码:276 / 282
页数:7
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