Electromagnetic Fault Injection as a New Forensic Approach for SoCs

被引:15
作者
Gaine, Clement [1 ,2 ]
Aboulkassimi, Driss [1 ,2 ]
Pontie, Simon [1 ,2 ]
Nikolovski, Jean-Pierre [1 ,2 ]
Dutertre, Jean-Max [3 ]
机构
[1] Ctr CMP, CEA Tech, Equipe Commune CEA Tech Mines St Etienne, F-13541 Gardanne, France
[2] Univ Grenoble Alpes, LETI, CEA, MINATEC Campus, F-38054 Grenoble, France
[3] Ctr CMP, Mines St Etienne, CEA Tech, Dept SAS, F-13541 Gardanne, France
来源
2020 IEEE INTERNATIONAL WORKSHOP ON INFORMATION FORENSICS AND SECURITY (WIFS) | 2020年
关键词
Electromagnetic Fault Injection; SoC; Forensic; Smartphones;
D O I
10.1109/WIFS49906.2020.9360902
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Smartphones have a complex hardware and software architecture. Having access to their full memory space can help solve judicial investigations. We propose a new privilege escalation technique in order to access hidden contents and execute sensitive operations. While classical forensic tools mostly exploit software vulnerabilities, it is based on a hardware security evaluation technique. Electromagnetic fault injection is such a technique usually used for microcontrollers or FPGA security characterization. A security function running at 1.2GHz on a 64-bit SoC with a Linux-based OS was successfully attacked. The Linux authentication module uses this function to verify the password correctness by comparing two hash values. Hence, this work constitutes a step towards smartphones privilege escalation through electromagnetic fault injection. This approach is interesting for addressing forensic issues on smartphones.
引用
收藏
页数:6
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