Improved Method for Permittivity Determination of Dielectric Samples by Free-Space Measurements

被引：33

作者：

Hasar, Ugur Cem ^{[1
]}

Kaya, Yunus ^{[2
]}

Ozturk, Hamdullah ^{[1
]}

Izginli, Mucahit ^{[3
]}

Ertugrul, Mehmet ^{[4
,5
,6
]}

Barroso, Joaquim Jose ^{[7
]}

Ramahi, Omar M. ^{[8
]}

机构：

[1] Gaziantep Univ, Dept Elect & Elect Engn, TR-27310 Gaziantep, Turkey

[2] Bayburt Univ, Dept Elect & Energy, TR-69000 Bayburt, Turkey

[3] Hasan Kalyoncu Univ, Dept Elect & Elect Engn, TR-27410 Gaziantep, Turkey

[4] Ataturk Univ, Dept Elect & Elect Engn, TR-25240 Erzurum, Turkey

[5] Univ Putra Malaysia, Dept Elect & Elect Engn, Bangi 43400, Selangor, Malaysia

[6] Kyrgyz Turkish Manas Univ, Fac Engn, Bishkek 720038, Kyrgyzstan

[7] Inst Tecnol Aeronaut, BR-12228900 Sao Jose Dos Campos, Brazil

[8] Univ Waterloo, Dept Elect & Comp Engn, Waterloo, ON N2L 3G1, Canada

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 2022年 / 71卷

基金：

英国科研创新办公室;

关键词：

Complex permittivity; deembedding technique; free-space; gating; uncalibrated measurements; CALIBRATION-INDEPENDENT METHOD; COMPLEX PERMITTIVITY; REFLECTION; RETRIEVAL; CONSTANT; RECONSTRUCTION; PARAMETERS; THICKNESS;

D O I：

10.1109/TIM.2022.3153991

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A new deembedding technique is proposed for relative complex permittivity epsilon(r) determination of dielectric materials using gated free-space measurements. Its three main features are 1) it does not require any formal calibration procedure (calibration-free); 2) it is position-insensitive; and 3) it extracts ripple-free epsilon(r) due to gating process. The objective function derived to determine epsilon(r) by the proposed method is validated by free-space measurements of three dielectric samples (polypropylene, polyethylene, and polyoxymethylene). Besides, the accuracy of our method is compared with the accuracy of other calibrationfree and calibration-dependent methods in the literature.

引用

页数：8

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