Ferroelectric domains in epitaxial PbTiO3 films on LaAlO3 substrate investigated by piezoresponse force microscopy and far-infrared reflectance

被引：12

作者：

Simon, E. ^{[1
]}

Borodavka, F. ^{[1
]}

Gregora, I. ^{[1
]}

Nuzhnyy, D. ^{[1
]}

Kamba, S. ^{[1
]}

Hlinka, J. ^{[1
]}

Bartasyte, A. ^{[2
]}

Margueron, S. ^{[3
]}

机构：

[1] Acad Sci Czech Republ, Inst Phys, Prague 18221 8, Czech Republic

[2] Nancy Univ, CNRS, UMR 7198, Inst Jean Lamour, F-54506 Vandoeuvre Les Nancy, France

[3] Univ Metz & Supelec, EA 4423, Lab Mat Opt Photon & Syst, F-57070 Metz, France

来源：

JOURNAL OF APPLIED PHYSICS | 2011年 / 110卷 / 08期

关键词：

MISFIT RELAXATION MECHANISMS; THIN-FILMS; CONFIGURATIONS; BIREFRINGENCE; STABILITY; CONSTANTS; MGO;

D O I：

10.1063/1.3651510

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Domain structures of 100-300 nm thin epitaxial films of ferroelectric PbTiO3 grown by metalorganic chemical vapor deposition technique on LaAlO3 perovskite substrate have been investigated by piezoresponse force microscopy and infrared reflectance spectroscopy techniques. Normal-incidence reflectance spectra reveal both E- and A(1)-symmetry modes of PbTiO3. The latter ones demonstrate the presence of a minor fraction of a-domains (with in-plane orientation of the spontaneous polarization) in the film. The piezoresponse force microscopy images allow to get local insight in the complex nanodomain architecture composed by few hundred nm large areas of primarily c/a/c/a but also a(1)/a(2)/a(1)/a(2) domain pattern types, with participation of all six tetragonal ferroelectric domain states and both 180 degrees and 90 degrees ferroelectric walls. (C) 2011 American Institute of Physics. [doi:10.1063/1.3651510]

引用

页数：6