Threshold voltage shifting for memory and tuning in printed transistor circuits

被引:39
作者
Dhar, Bal Mukund [1 ]
Oezguen, Recep [2 ]
Dawidczyk, Tom [1 ]
Andreou, Andreas [2 ]
Katz, Howard E. [1 ]
机构
[1] Johns Hopkins Univ, Dept Mat Sci & Engn, 3400 N Charles St, Baltimore, MD 21218 USA
[2] Johns Hopkins Univ, Dept Elect & Comp Engn, Baltimore, MD 21218 USA
基金
美国国家科学基金会;
关键词
Organic Transistors; Memory; Threshold Voltage; Printed Electronics; Circuit Tuning; Charged Dielectrics; FIELD-EFFECT TRANSISTORS; THIN-FILM TRANSISTORS; SELF-ASSEMBLED MONOLAYERS; GATE DIELECTRICS; TEMPERATURE-DEPENDENCE; DEVICE CHARACTERISTICS; AMBIPOLAR TRANSPORT; FERROELECTRIC/METAL INTERFACE; PERFORMANCE CORRELATIONS; ELECTRICAL-PROPERTIES;
D O I
10.1016/j.mser.2010.11.001
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Multiple mechanisms for controllably shifting the threshold voltage of printed and organic transistors have been identified during the last few years, including some just in the past year, that are analogous in some ways to silicon floating gate memory elements. In addition, printed electronic memory is emerging as a serious product technology for identification and banking cards and for responsive systems through the efforts of startup companies. Other circuit applications are also being identified. Memory and tuning are not as prominently discussed in the literature as simpler and more accessible topics such as display driving, charge carrier mobility, voltage reduction, and high-frequency response. This report summarizes the numerous approaches being considered for the definition and control of transistor threshold voltage in alternative electronic technologies, including the theoretical basis for the effects utilized. Higher and more reliable performance parameters and entirely new functionality are among the advantages to be highlighted. (C) 2010 Elsevier B.V. All rights reserved.
引用
收藏
页码:49 / 80
页数:32
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