Effect of tip polarity on Kelvin probe force microscopy images of thin insulator CaF2 films on Si(111)

被引：10

作者：

Yurtsever, Ayhan ^{[1
,2
]}

Sugimoto, Yoshiaki ^{[1
]}

Fukumoto, Masaki ^{[1
]}

Abe, Masayuki ^{[1
,3
]}

Morita, Seizo ^{[1
,2
]}

机构：

[1] Osaka Univ 2 1, Grad Sch Engn, Suita, Osaka 5650871, Japan

[2] Osaka Univ, Inst Sci & Ind Res, Ibaraki, Osaka 5670047, Japan

[3] Nagoya Univ, Grad Sch Engn, Chikusa Ku, Nagoya, Aichi 4648603, Japan

来源：

APPLIED PHYSICS LETTERS | 2012年 / 101卷 / 08期

关键词：

FREQUENCY-MODULATION-DETECTION; MOLECULE;

D O I：

10.1063/1.4748291

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We investigate thin insulating CaF2 films on a Si (111) surface using a combination of noncontact atomic force microscopy (NC-AFM) and Kelvin probe force microscopy (KPFM). Atomic-scale NC-AFM and KPFM images are obtained in different imaging modes by employing two different tip polarities. The KPFM image contrast and the distance-dependent variation of the local contact potential difference (LCPD) give rise to a tip-polarity-dependent contrast inversion. Ca2+ cations had a higher LCPD contrast than F- anions for a positively terminated tip, while the LCPD provided by a negatively charged tip gave a higher contrast for F- anions. Thus, this result implies that it is essential to determine the tip apex polarity to correctly interpret LCPD signals acquired by KPFM. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4748291]

引用

页数：4

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