共 10 条
[4]
FURJES P, 2003, P EUROTHERM, P59
[7]
Lock-in IR-thermography - A novel tool for material and device characterization
[J].
GETTERING AND DEFECT ENGINEERING IN SEMICONDUCTOR TECHNOLOGY,
2002, 82-84
:741-746
[9]
RENCZ M, 2001, FUTURE CIRCUITS INT, P51
[10]
ON THE REPRESENTATION OF INFINITE-LENGTH DISTRIBUTED RC ONE-PORTS
[J].
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS,
1991, 38 (07)
:711-719