Novel rare earth Gd and Al co-doped ZnO thin films prepared by nebulizer spray method for optoelectronic applications

被引:52
作者
Anand, V. [1 ]
Sakthivelu, A. [2 ]
Kumar, K. Deva Arun [3 ]
Valanarasu, S. [3 ]
Ganesh, V. [4 ,6 ]
Shkir, Mohd [4 ]
Kathalingam, A. [5 ]
AlFaify, S. [4 ]
机构
[1] VKS Coll Engn & Technol, Dept Phys, Karur, India
[2] Periyer EVR Coll, PG & Res Dept Phys, Tiruchirappalli, India
[3] Arul Anandar Coll, PG & Res Dept Phys, Madurai, Tamil Nadu, India
[4] King Khalid Univ, AFMOL, Dept Phys, Fac Sci, POB 9004, Abha, Saudi Arabia
[5] Dongguk Univ, Millimeter Wave Innovat Technol Res Ctr MINT, Seoul 04620, South Korea
[6] King Khalid Univ, RCAMS, POB 9004, Abha 61413, Saudi Arabia
关键词
Al and Gd co-doping; AZO thin film; Rare earth material; Optical properties; Electronic properties; CHEMICAL-VAPOR-DEPOSITION; OPTICAL-PROPERTIES; ZINC-OXIDE; ELECTRICAL-PROPERTIES; DOPING CONCENTRATION; TRANSPARENT; ALUMINUM; PYROLYSIS; NANOSTRUCTURES;
D O I
10.1016/j.spmi.2018.09.014
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
In this study, for the first time, rare earth element gadolinium and aluminum co-doped zinc oxide (Gd:AZO) films were prepared on insulating glass plates using cost-effective nebulizer spray method with various Gd co-doping levels (0, 0.5, 1 and 1.5 at.%). The deposited films were characterized using X-ray diffraction, FT-Raman, AFM, EDAX, UV-VIS spectroscopy, Photoluminescence (PL) spectrum and Hall Effect measurement at room temperature. From XRD study, it is confirmed that the Gd and Al ions are incorporated into ZnO lattice. Film crystallinity is slightly reduced due to Gd content by increasing lattice defects. Topology of AFM images displays a slight increase of Gd:AZO thin film roughness from 20 nm to 36 nm, with an increase of thickness from 232 to 324 nm respectively. Elemental mapping and EDAX studies confirmed the existence of Zn, O, Al and Gd elements in the prepared Gd:AZO thin films. Spray deposited pristine AZO films showed maximum optical transmittance similar to 91% in entire wavelength spectrum and energy gap value similar to 3.31eV. The observed PL spectra showed as a UV emission at 387 nm for deposited films. The obtained minimum resistivity and maximum figure of merit values are 3.42 x 10(-4) Omega cm, and 18.68 x 10(-3) (Omega/sq)(-1), respectively for 1.5 at.% Gd co-doped AZO thin film. Both values are decent enough for opto-electronic devices.
引用
收藏
页码:311 / 322
页数:12
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