The software package ANAELU for X-ray diffraction analysis using two-dimensional patterns

被引：23

作者：

Fuentes-Montero, Luis ^{[1
]}

Elena Montero-Cabrera, Maria ^{[2
]}

Fuentes-Cobas, Luis ^{[2
]}

机构：

[1] Inst Laue Langevin, Diffract Grp, F-38000 Grenoble, France

[2] Ctr Invest Mat Avanzados, Chihuahua 31109, Mexico

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2011年 / 44卷

关键词：

X-ray diffraction modelling; area detectors; texture analysis; fibre texture; ANAELU; BILBAO CRYSTALLOGRAPHIC SERVER; TEXTURE ANALYSIS; FILMS; SCATTERING; DETECTOR; SYSTEM; SCALES; IMAGE;

D O I：

10.1107/S0021889810048739

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

A new software package for interpreting two-dimensional diffraction diagrams is presented. The application capabilities include representation of single- and polycrystal structures with an inverse pole figure treatment of texture phenomena, measurement and analysis of diffraction signals, and different approaches to the modelling of two-dimensional diffraction patterns obtained from both single-crystal and polycrystalline samples. Particular consideration is given to the effect of axially symmetric textures on two-dimensional diffraction patterns. An example showing the capabilities of the software is presented.

引用

页码：241 / 246

页数：6

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