The software package ANAELU for X-ray diffraction analysis using two-dimensional patterns

被引：23

作者：

Fuentes-Montero, Luis ^{[1
]}

Elena Montero-Cabrera, Maria ^{[2
]}

Fuentes-Cobas, Luis ^{[2
]}

机构：

[1] Inst Laue Langevin, Diffract Grp, F-38000 Grenoble, France

[2] Ctr Invest Mat Avanzados, Chihuahua 31109, Mexico

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2011年 / 44卷

关键词：

X-ray diffraction modelling; area detectors; texture analysis; fibre texture; ANAELU; BILBAO CRYSTALLOGRAPHIC SERVER; TEXTURE ANALYSIS; FILMS; SCATTERING; DETECTOR; SYSTEM; SCALES; IMAGE;

D O I：

10.1107/S0021889810048739

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

A new software package for interpreting two-dimensional diffraction diagrams is presented. The application capabilities include representation of single- and polycrystal structures with an inverse pole figure treatment of texture phenomena, measurement and analysis of diffraction signals, and different approaches to the modelling of two-dimensional diffraction patterns obtained from both single-crystal and polycrystalline samples. Particular consideration is given to the effect of axially symmetric textures on two-dimensional diffraction patterns. An example showing the capabilities of the software is presented.

引用

页码：241 / 246

页数：6

共 29 条

[1] Bilbao crystallographic server. II. Representations of crystallographic point groups and space groups [J].

Aroyo, MI ;

Kirov, A ;

Capillas, C ;

Perez-Mato, JM ;

Wondratschek, H .

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2006, 62 :115-128

[2] Bilbao crystallographic server: I. Databases and crystallographic computing programs [J].

Aroyo, MI ;

Perez-Mato, JM ;

Capillas, C ;

Kroumova, E ;

Ivantchev, S ;

Madariaga, G ;

Kirov, A ;

Wondratschek, H .

ZEITSCHRIFT FUR KRISTALLOGRAPHIE, 2006, 221 (01) :15-27

[3]

Bunge H.J., 1982, TEXTURE ANAL MAT SCI

[4] Diffuse x-ray scattering in perovskite ferroelectrics [J].

Chapman, BD ;

Stern, EA ;

Han, SW ;

Cross, JO ;

Seidler, GT ;

Gavrilyatchenko, V ;

Vedrinskii, RV ;

Kraizman, VL .

PHYSICAL REVIEW B, 2005, 71 (02)

[5] Direct structural determination in ultrathin ferroelectric films by analysis of synchrotron x-ray scattering measurements [J].

Fong, DD ;

Cionca, C ;

Yacoby, Y ;

Stephenson, GB ;

Eastman, JA ;

Fuoss, PH ;

Streiffer, SK ;

Thompson, C ;

Clarke, R ;

Pindak, R ;

Stern, EA .

PHYSICAL REVIEW B, 2005, 71 (14)

[6] Ferroelectricity in ultrathin perovskite films [J].

Fong, DD ;

Stephenson, GB ;

Streiffer, SK ;

Eastman, JA ;

Auciello, O ;

Fuoss, PH ;

Thompson, C .

SCIENCE, 2004, 304 (5677) :1650-1653

[7] ANOMALOUS SCATTERING AND NULL-DOMAIN GHOST CORRECTIONS FOR FIBER TEXTURES [J].

FUENTES, L .

TEXTURES AND MICROSTRUCTURES, 1989, 10 (04) :347-360

[8]

Giacovazzo C., 2002, FUNDAMENTALS CRYSTAL

[9] Two-dimensional detector software: From real detector to idealised image or two-theta scan [J].

Hammersley, AP ;

Svensson, SO ;

Hanfland, M ;

Fitch, AN ;

Hausermann, D .

HIGH PRESSURE RESEARCH, 1996, 14 (4-6) :235-248

[10] Introduction to two-dimensional X-ray diffraction [J].

He, BBP .

POWDER DIFFRACTION, 2003, 18 (02) :71-85

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