Characterization of phase evolution in YBCO coated conductors produced by the ex situ BaF2 process

被引:9
作者
Feenstra, R. [1 ]
List, F. A.
Zhang, Y.
Christen, D. K.
Maroni, V. A.
Miller, D. J.
Feldmann, D. M.
机构
[1] Oak Ridge Natl Lab, Oak Ridge, TN 37831 USA
[2] Argonne Natl Lab, Argonne, IL 60439 USA
[3] Univ Wisconsin, Dept Appl Phys, Madison, WI 53706 USA
关键词
high-temperature superconductors; Raman spectroscopy; superconducting epitaxial layers; thick films;
D O I
10.1109/TASC.2007.899994
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Raman microprobe spectroscopy and scanning electron microscopy were used to study the initial nucleation and growth of YBCO in thick precursors by the BaF2 ex situ process. For quenched films of 2 mu m thickness, the data indicate a low density of c-axis nuclei near the substrate, apparently due to a reduced oxygen concentration deep inside the precursor layer. Significant non c-axis growth was also observed; the majority of this material nucleates away from the substrate. Measurement of the conversion rate by in situ XRD for films in the range 0.2-2 mu m suggest a weak thickness dependence.
引用
收藏
页码:3254 / 3258
页数:5
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