Scavenging of excess Cu atoms in CuInS2 films by sulphur annealing

被引:19
作者
Scheer, R
Luck, I
Sehnert, H
Lewerenz, HJ
机构
[1] Hahn-Meitner-Institut Berlin, Abteilung Grenzflächen, 14109 Berlin
关键词
D O I
10.1016/0927-0248(95)00106-9
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
We have investigated Cu-In-S films with positive non-molecularity Delta m = ([Cu]/[ln]) - 1 grown by different preparation techniques such as coevaporation, sulphurization of stacked elemental layers, and spray pyrolysis. Using X-ray diffraction and electron spectroscopy, we have looked for the formation of Cu chalcogenide secondary phases. It was found that films grown by coevaporation and sulphurization establish a CuS overlayer at the front surface of the films. The CuS segregation is missing for films which are grown by spray pyrolysis, however it can be induced for these films by annealing in H2S. It is shown that the sulphur acts as scavenger for excess Cu atoms in the CuInS2 matrix. Furthermore, we prove that the induced CuS segregation promotes the recrystallization of the films.
引用
收藏
页码:261 / 270
页数:10
相关论文
共 15 条
[1]  
[Anonymous], P 12 EUR PHOT SOL EN
[2]   PHASE-RELATIONS IN THE SYSTEM CU2S-IN2S3 [J].
BINSMA, JJM ;
GILING, LJ ;
BLOEM, J .
JOURNAL OF CRYSTAL GROWTH, 1980, 50 (02) :429-436
[3]   ELECTRONIC-STRUCTURE OF THE TERNARY CHALCOPYRITE SEMICONDUCTORS CUA1S2, CUGAS2, CUINS2, CUA1SE2, CUGASE2, AND CUINSE2 [J].
JAFFE, JE ;
ZUNGER, A .
PHYSICAL REVIEW B, 1983, 28 (10) :5822-5847
[4]   CHEMICAL DIFFUSION-COEFFICIENTS AND STABILITY OF CUINS2 AND CUINSE2 FROM POLARIZATION MEASUREMENTS WITH POINT ELECTRODES [J].
KLEINFELD, M ;
WIEMHOFER, HD .
SOLID STATE IONICS, 1988, 28 :1111-1115
[5]   A MODEL FOR THE SUCCESSFUL GROWTH OF POLYCRYSTALLINE FILMS OF CUINSE2 BY MULTISOURCE PHYSICAL VACUUM EVAPORATION [J].
KLENK, R ;
WALTER, T ;
SCHOCK, HW ;
CAHEN, D .
ADVANCED MATERIALS, 1993, 5 (02) :114-119
[6]  
MIGGE H, 1992, J MATER RES, V9, P125
[7]   CULNS2 BASED THIN-FILM SOLAR-CELL WITH 10.2-PERCENT EFFICIENCY [J].
SCHEER, R ;
WALTER, T ;
SCHOCK, HW ;
FEARHEILEY, ML ;
LEWERENZ, HJ .
APPLIED PHYSICS LETTERS, 1993, 63 (24) :3294-3296
[8]   PHOTOEMISSION-STUDY OF EVAPORATED CUINS(2) THIN-FILMS .2. ELECTRONIC SURFACE-STRUCTURE [J].
SCHEER, R ;
LEWERENZ, HJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1994, 12 (01) :56-60
[9]   PHOTOEMISSION-STUDY OF EVAPORATED CUINS(2) THIN-FILMS .1. SURFACE STOICHIOMETRY AND PHASE SEGREGATION [J].
SCHEER, R ;
LEWERENZ, HJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1994, 12 (01) :51-55
[10]   FORMATION OF SECONDARY PHASES IN EVAPORATED CUINS2 THIN-FILMS - A SURFACE ANALYTICAL STUDY [J].
SCHEER, R ;
LEWERENZ, HJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1995, 13 (04) :1924-1929