A hybrid surface passivation on HgCdTe long wave infrared detector with in-situ CdTe deposition and high-density hydrogen plasma modification

被引:173
作者
Hu, W. D. [1 ]
Chen, X. S. [1 ]
Ye, Z. H. [2 ]
Lu, W. [1 ]
机构
[1] Chinese Acad Sci, Shanghai Inst Tech Phys, Natl Lab Infrared Phys, Shanghai 200083, Peoples R China
[2] Chinese Acad Sci, Shanghai Inst Tech Phys, Key Lab Infrared Imaging Mat & Detectors, Shanghai 200083, Peoples R China
基金
中国国家自然科学基金;
关键词
PHOTODIODES;
D O I
10.1063/1.3633103
中图分类号
O59 [应用物理学];
学科分类号
摘要
A hybrid surface passivation, in-situ CdTe passivation and high-density hydrogen plasma modification, is used to improve the surface quality of typical n(+)-on-p HgCdTe long wave infrared photodiode detectors. Three types of surface-passivated pixels, conventional, in-situ CdTe, and hybrid surface passivation, are fabricated in one chip for better comparison. The maximum dynamic resistances of the hybrid-surface-passivation device are increased to 1 similar to 2 times greater than that in the conventional surface passivation technique. Theoretical modeling shows that the hybrid passivation can significantly suppress the trap-assisted tunneling current. Shallow traps close to the Fermi level under reverse voltage, which are the main source of the trap-assisted tunneling current for conventional surface passivation processing, are reduced by the hybrid passivation treatment. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3633103]
引用
收藏
页数:3
相关论文
共 14 条
[1]   Study on optimizing the performance of infrared detectors using material chip technology [J].
Chen, GB ;
Lu, W ;
Chen, XS ;
Li, ZF ;
Cai, WY ;
He, L ;
Hui, XN ;
Li, YJ ;
Shen, SC .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2003, 18 (09) :887-890
[2]   Analysis of temperature dependence of dark current mechanisms for long-wavelength HgCdTe photovoltaic infrared detectors [J].
Hu, W. D. ;
Chen, X. S. ;
Yin, F. ;
Quan, Z. J. ;
Ye, Z. H. ;
Hu, X. N. ;
Li, Z. F. ;
Lu, W. .
JOURNAL OF APPLIED PHYSICS, 2009, 105 (10)
[3]   An improvement on short-wavelength photoresponse for a heterostructure HgCdTe two-color infrared detector [J].
Hu, Wei-Da ;
Chen, Xiao-Shuang ;
Ye, Zhen-Hua ;
Lu, Wei .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2010, 25 (04)
[4]   Accurate Simulation of Temperature-Dependent Dark Current in HgCdTe Infrared Detectors Assisted by Analytical Modeling [J].
Hu, Weida ;
Chen, Xiaoshuang ;
Ye, Zhenhua ;
Zhang, Jing ;
Yin, Fei ;
Lin, Chun ;
Li, Zhifeng ;
Lu, Wei .
JOURNAL OF ELECTRONIC MATERIALS, 2010, 39 (07) :981-985
[5]   Generation-recombination effects on dark currents in CdTe-passivated midwave infrared HgCdTe photodiodes [J].
Jozwikowska, A ;
Jozwikowski, K ;
Antoszewski, J ;
Musca, CA ;
Nguyen, T ;
Sewell, RH ;
Dell, JM ;
Faraone, L ;
Orman, Z .
JOURNAL OF APPLIED PHYSICS, 2005, 98 (01)
[6]   Surface leakage current analysis of ion implanted ZnS-passivated n-on-p HgCdTe diodes in weak inversion [J].
Kim, YH ;
Bae, SH ;
Lee, HC ;
Kim, CK .
JOURNAL OF ELECTRONIC MATERIALS, 2000, 29 (06) :832-836
[7]   Universal 1/f noise model for reverse biased diodes [J].
Kinch, M. A. ;
Wan, C. -F. ;
Schaake, H. ;
Chandra, D. .
APPLIED PHYSICS LETTERS, 2009, 94 (19)
[8]   Behavior of elemental tellurium as surface generation-recombination centers in CdTe/HgCdTe interface [J].
Lee, Min Yung ;
Lee, Yong Soo ;
Lee, Hee Chul .
APPLIED PHYSICS LETTERS, 2006, 88 (20)
[9]   Effects of hydrazine surface treatment on HgCdTe long-wavelength infrared photodiodes [J].
Lee, MY ;
Lee, YS ;
Lee, HC .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 2005, 44 (37-41) :L1252-L1255
[10]  
Norton P, 2002, OPTO-ELECTRON REV, V10, P159