Anatomy an in-flight anomaly: Investigation of proton-induced SEE test results for stacked IBM DRAMs

被引：26

作者：

LaBel, KA ^{[1
]}

Marshall, PW

Barth, JL

Katz, RB

Reed, RA

Leidecker, HW

Kim, HS

Marshall, CJ

机构：

[1] NASA, Goddard Space Flight Ctr, Greenbelt, MD 20771 USA

[2] Jackson & Tull Chartered Engineers, Lanham, MD 20706 USA

[3] NRL, Washington, DC 20375 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1998年 / 45卷 / 06期

基金：

美国国家航空航天局;

关键词：

D O I：

10.1109/23.736545

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We present ground test and space flight data describing a single event anomaly that affects multiple bytes in a stacked DRAM module. A 12 Gbit solid state recorder containing 1,440 DRAM die experiences the anomalous events at a rate requiring testing of a large sample set of these modules.

引用

页码：2898 / 2903

页数：6

共 11 条

[1] SPACE RADIATION EVALUATION OF 16-MBIT DRAMS FOR MASS MEMORY APPLICATIONS
CALVEL, P
LAMOTHE, P
BARILLOT, C
ECOFFET, R
DUZELLIER, S
STASSINOPOULOS, EG
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1994, 41 (06) : 2267 - 2271
[2] Harboe-Sorensen R., 1995, 1995 IEEE Radiation Effects Data Workshop. NSREC '95. Workshop Record. Held in Conjunction with the IEEE Nuclear and Space Radiation Effects Conference (Cat. No.95TH8149), P42, DOI 10.1109/REDW.1995.483375
[3] JOHNSON GH, 1996, IEEE NUCL NUCL SPACE
[4] Radiation effects in advanced microelectronics technologies
Johnston, AH
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1998, 45 (03) : 1339 - 1354
[5] Radiation effects on current field programmable technologies
Katz, R
LaBel, K
Wang, JJ
Cronquist, B
Koga, R
Penzin, S
Swift, G
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1997, 44 (06) : 1945 - 1956
[6] SEU HARDENING OF FIELD-PROGRAMMABLE GATE ARRAYS (FPGAS) FOR SPACE APPLICATIONS AND DEVICE CHARACTERIZATION
KATZ, R
BARTO, R
MCKERRACHER, P
KOGA, R
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1994, 41 (06) : 2179 - 2186
[7] KATZ R, PROGRAMMABLE TECHNOL
[8] KOGA R, 1997, P RADECS97, P311
[9] Radiation effect characterization and test methods of single-chip and multi-chip stacked 16Mbit DRAMs
LaBel, KA
Gates, MM
Moran, AK
Kim, HS
Seidleck, CM
Marshall, P
Kinnison, J
Carkhuff, B
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1996, 43 (06) : 2974 - 2981
[10] Single-event-effect mitigation from a system perspective
LaBel, KA
Gates, NM
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1996, 43 (02) : 654 - 660

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