Design, Fabrication, and Characterization of Scandium Aluminum Nitride-Based Piezoelectric Micromachined Ultrasonic Transducers

This paper presents the design, fabrication, and characterization of piezoelectric micromachined ultrasound transducers (PMUTs) based on scandium aluminum nitride (ScxAl(1-x)N) thin films (x = 15%). ScAlN thin film was prepared with a dual magnetron system and patterned by a reactive ion etching system utilizing chlorine-based chemistry with an etching rate of 160 nm/min. The film was characterized by X-ray diffraction, which indicated a crystalline structure expansion compared with pure AlN and a well-aligned ScAlN film. ScAlN PMUTs were fabricated by a two-mask process based on cavity SOI wafers. ScAlN PMUTs with 50- and 40-mu m diameter had a large dynamic displacement sensitivity measured in air of 25 nm/V at 17 MHz and 10 nm/V at 25 MHz, twice that of AlN PMUTs with the same dimensions. The peak displacement as a function of electrode coverage was characterized, with maximum displacement achieved with an electrode radius equal to 70% of the PMUT radius. Electrical impedance measurements indicated that the ScAlN PMUTs had 36% greater electromechanical coupling coefficient (k(t)(2)) compared with AlN PMUTs. The output pressure of a 7 x 7 ScAlN PMUT array was 0.7 kPa/V at similar to 1.7 mm away from the array, which is approximately three times greater that of an 8 x 8 AlN PMUT array with the same element geometry and fill factor measured at the same distance. Acoustic spreading loss and PMUT insertion loss from mechanical transmit to receive were characterized with a 15 x 15 ScAlN PMUT array via hydrophone and laser Doppler vibrometer.