Electrical properties of CNx nanotubes probed in a transmission electron microscope

Knowledge of the mechanical and electrical characteristics of one-dimensional nanostructures is critical for their future integration in nanoelectronic circuits. The present study analyses the behaviour of N-doped carbon nanotubes (CNx,x < 0.1) under applied stresses inside a transmission electron microscope. The electrical resistance changes observed were substantial, with figures ranging from 42 to 182 k Omega, and are largely correlated with the extension of the contact area (electrode-nanotube or nanotube-nanotube). Despite the repeated deformation cycles and high bending angles achieved, the nanotubes kept their metallic nature throughout. In addition to this, it was noticed that the CNx nanotubes presented sections with several structural defects which acted as joints during their controlled bending. These areas represent high-resistive points which may lead to fatal structural failure, as demonstrated in the current induced failure experiments here reported.