Lower Bounds of the Size of Shared Structurally Synthesized BDDs

被引:0
作者
Ubar, Raimund [1 ]
Mironov, Dmitri [1 ]
机构
[1] Tallinn Univ Technol, EE-19086 Tallinn, Estonia
来源
PROCEEDINGS OF THE 2014 IEEE 17TH INTERNATIONAL SYMPOSIUM ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS & SYSTEMS (DDECS) | 2014年
关键词
digital circuits; logic models and simulation; Binary Decision Diagrams; Shared Structurally Synthesized BDDs; lower bounds;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A novel type of BDDs called Shared Structurally Synthesized BDDs (S3BDD) is presented as an extension of the SSBDDs, and a method is given to minimize the size of the model. As in case of SSBDDs, the S3BDDs have linear complexity compared to the size of the logic circuit they represent, and they are characterized by the property of one-to-one mapping between the nodes of graphs and signal paths in the circuit. Minimization of S3BDDs makes it possible to get higher rates in fault collapsing, and to speed-up logic simulation as a main tool in delay analysis, fault reasoning and test generation. A lower bound is developed for the size of S3BDDs to evaluate the results of S3BDD synthesis, and it is shown that this bound can be reached rather closely by a straightforward method. Experimental results demonstrate that the S3BDDs represent the most compact BDD based model representing the structure of the digital circuits, which has in average 1.5 times less nodes than the SSBDDs.
引用
收藏
页码:77 / 82
页数:6
相关论文
共 20 条
  • [1] AKERS SB, 1978, IEEE T COMPUT, V27, P509, DOI 10.1109/TC.1978.1675141
  • [2] [Anonymous], P TALLINN TU
  • [3] [Anonymous], P INT TEST C
  • [4] [Anonymous], MINIMIZATION FREE BD
  • [5] Brace K. S., 1990, 27th ACM/IEEE Design Automation Conference. Proceedings 1990 (Cat. No.90CH2894-4), P40, DOI 10.1109/DAC.1990.114826
  • [6] BRGLEZ F, 1989, 1989 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1-3, P1929, DOI 10.1109/ISCAS.1989.100747
  • [7] BRYANT RE, 1986, IEEE T COMPUT, V35, P677, DOI 10.1109/TC.1986.1676819
  • [8] Jutman A., 2001, IEEE P DES AUT TEST, P460
  • [9] Jutman A., 2003, 4 EL CIRC SYST C SEP, P17
  • [10] Jutman A., 2002, 5 INT WORKSH BOOL PR, P157