X-ray diffraction strain analysis of a single axial InAs1-xPx nanowire segment

被引：10

作者：

Keplinger, Mario ^{[1
]}

Mandl, Bernhard ^{[1
,2
]}

Kriegner, Dominik ^{[1
]}

Holy, Vaclav ^{[3
]}

Samuelsson, Lars ^{[2
]}

Bauer, Gunther ^{[1
]}

Deppert, Knut ^{[2
]}

Stangl, Julian ^{[1
]}

机构：

[1] Johannes Kepler Univ Linz, A-4040 Linz, Austria

[2] Lund Univ, S-22100 Lund, Sweden

[3] Charles Univ Prague, Fac Math & Phys, CR-12116 Prague, Czech Republic

来源：

JOURNAL OF SYNCHROTRON RADIATION | 2015年 / 22卷

基金：

瑞典研究理事会; 奥地利科学基金会;

关键词：

nanowire; nano-focus; strain analysis; hetero-structure; finite-element simulation; INAS; GROWTH;

D O I：

10.1107/S160057751402284X

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The spatial strain distribution in and around a single axial InAs1-xPx hetero-segment in an InAs nanowire was analyzed using nano-focused X-ray diffraction. In connection with finite-element-method simulations a detailed quantitative picture of the nanowire's inhomogeneous strain state was achieved. This allows for a detailed understanding of how the variation of the nanowire's and hetero-segment's dimensions affect the strain in its core region and in the region close to the nanowire's side facets. Moreover, ensemble-averaging high-resolution diffraction experiments were used to determine statistical information on the distribution of wurtzite and zinc-blende crystal polytypes in the nanowires.

引用

页码：59 / 66

页数：8

共 25 条

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[Anonymous], 1992, THEORY DISLOCATIONS

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