Future trends in online testing: A new VLSI design paradigm?

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作者：

Nicolaidis, M

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来源：

IEEE DESIGN & TEST OF COMPUTERS | 1998年 / 15卷 / 04期

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TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

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页码：15 / 16

页数：2

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