Power Supply Noise Reduction in Broadcast-Based Compression Environment for At-Speed Scan Testing

被引：1

作者：

Liang, Chun-Yong ^{[1
]}

Wu, Meng-Fan ^{[2
]}

Huang, Jiun-Lang ^{[1
,2
]}

机构：

[1] Natl Taiwan Univ, Grad Inst Elect Engn, Taipei 106, Taiwan

[2] Natl Taiwan Univ, Dept Elect Engn, Taipei 106, Taiwan

来源：

2010 19TH IEEE ASIAN TEST SYMPOSIUM (ATS 2010) | 2010年

关键词：

broadcast; at-speed testing; test compression; power supply noise; TEST APPLICATION TIME; TEST DATA VOLUME; PEAK POWER; ARCHITECTURE;

D O I：

10.1109/ATS.2010.68

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

This work proposes a power supply noise reduction technique for at-speed testing in the broadcast-based test compression environment. The core technology is the X-slice creation technique; it comprises the scan-chain skew-insertion hardware and the skew configuration generation algorithm. With the created X-slices, the efficiency of X-slice filling to lower the launch cycle switching activity is improved. Effectiveness of the proposed technique is validated with ISCAS89 and ITC99 benchmark circuits.

引用

页码：361 / 366

页数：6

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