Fast analysis of bistatic scattering problems with compressive sensing technique

This paper presents a new method hybriding compressive sensing (CS) and the method of moments (MoM) to efficiently analyze bistatic scattering problems. To perform a bistatic scattering analysis by the new method, the electric field integral equation is firstly constituted and discretized into matrix equation form based on MoM. And then the CS measurements are implemented to obtain the samples of the original signal (In our case, the original signal is the incident wave and induced currents over the surface of the object) by introducing a measurement matrix. Finally, a CS reversion is employed to reconstruct the original signal (the unknown currents) from its lower dimensional measured data. Therefore, by introducing the notion of CS theory, the new method stepped over the computational expensive matrix equation solving procedure in performing a bistatic scattering analysis. Numerical simulations show that the CS framework is able to provide good results, while reducing the number of computations requirement and providing computation acceleration.