共 24 条
- [1] A high performance 0.25 mu m logic technology optimized for 1.8V operation [J]. IEDM - INTERNATIONAL ELECTRON DEVICES MEETING, TECHNICAL DIGEST 1996, 1996, : 847 - 850
- [3] CHU WC, 1997, IN PRESS APPL PHYS L
- [5] GOTO K, 1997, IN PRESS IEDM
- [6] HELLENMANS A, 1988, TIMETABLE SCI
- [7] Low-energy ion damage in semiconductors: A progress report [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (06): : 3632 - 3636
- [8] *IND TECHN COUNC M, 1997, ACTA FIN REP