Large-Area Deposition of MoS2 by Pulsed Laser Deposition With In Situ Thickness Control

被引:204
作者
Serna, Martha I. [1 ]
Yoo, Seong H. [4 ]
Moreno, Salvador [2 ,3 ]
Xi, Yang [1 ]
Oviedo, Juan Pablo [1 ]
Choi, Hyunjoo [4 ]
Alshareef, Husam N. [5 ]
Kim, Moon J. [1 ]
Minary-Jolandan, Majid [2 ,3 ]
Quevedo-Lopez, Manuel A. [1 ]
机构
[1] Univ Texas Dallas, Dept Mat Sci & Engn, Richardson, TX 75080 USA
[2] Univ Texas Dallas, Dept Mech Engn, Richardson, TX 75080 USA
[3] Univ Texas Dallas, Alan G MacDiarmid NanoTech Inst, Richardson, TX 75080 USA
[4] Kookmin Univ, Dept Adv Mat Engn, Seoul 136702, South Korea
[5] King Abdullah Univ Sci & Technol, Thuwal, Saudi Arabia
基金
美国国家科学基金会; 新加坡国家研究基金会;
关键词
2D materials; MoS2; pulsed laser deposition; PLD; engineered target; electrical properties; layered materials; THIN-FILM TRANSISTORS; VAPOR-PHASE GROWTH; FEW-LAYER MOS2; HIGH-MOBILITY; EXFOLIATION; PHOTOLUMINESCENCE; EMISSION;
D O I
10.1021/acsnano.6b01636
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
A scalable and catalyst-free method to deposit stoichiometric molybdenum disulfide (MoS2) films over large areas is reported, with the maximum area limited by the size of the substrate holder. The method allows deposition of MoS2 layers on a wide range of substrates without any additional surface preparation, including single-crystal (sapphire and quartz), polycrystalline (HfO2), and amorphous (SiO2) substrates. The films are deposited using carefully designed MoS2 targets fabricated with excess sulfur and variable MoS2 and sulfur particle size. Uniform and layered MoS2 films as thin as two monolayers, with an electrical resistivity of 1.54 X 10(4) Omega cm(-1), were achieved. The MoS2 stoichiometry was confirmed by high-resolution Rutherford backscattering spectrometry. With the method reported here, in situ graded MoS2 films ranging from similar to 1 to 10 monolayers can be deposited.
引用
收藏
页码:6054 / 6061
页数:8
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