Structural and electrical properties of flash evaporated (Bi0.4Sb0.6)2Te3 alloy thin films

被引：1

作者：

Das, VD ^{[1
]}

Ganesan, PG ^{[1
]}

机构：

[1] Indian Inst Technol, Dept Phys, Thin Film Lab, Madras 600036, Chennai, India

来源：

PROCEEDINGS ICT'97 - XVI INTERNATIONAL CONFERENCE ON THERMOELECTRICS | 1997年

关键词：

D O I：

10.1109/ICT.1997.667047

中图分类号：

O414.1 [热力学];

学科分类号：

摘要：

The alloys of (Bi1-xSbx)(2)Te-3 are the best materials currently available for thermoelectric application near room temperature. Thin films of (Bi0.4Sb0.6)(2)Te-3 alloy were prepared by flash evaporation technique onto clean glass substrates held at room temperature in a vacuum of 1 x 10(-5) torr. Thickness of the films was monitored by a quartz crystal thickness monitor. Structural characterisation was carried out by X-Ray Diffraction (XRD) and Transmission Electron Microscopy (TEM). It was found that the structure of the alloy films is hexagonal and the films are polycrystalline. Electrical resistivity and thermoelectric measurements were carried out on these films in the temperature, range 300 K to 450 K. From the electrical resistivity measurements, the plot of Ln(sigma) vs 1000/T was drawn. From the plot of thermoelectric power against temperature, the nature of films has been identified. These parameters are found to influence the figure merit of the alloy films.

引用

页码：147 / 150

页数：4