Magnetic Modeling of a MEMS Flux Concentrator

被引:2
|
作者
Fischer, G. A. [1 ]
Edelstein, A. S. [1 ]
机构
[1] USA, Res Lab, Adelphi, MD 20783 USA
来源
2010 IEEE SENSORS | 2010年
关键词
FIELD AMPLIFICATION; SENSORS; NOISE;
D O I
10.1109/ICSENS.2010.5690690
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Magnetic flux concentrators are soft magnetic materials typically used to focus magnetic field lines in an effort to increase the sensitivity of a magnetic sensor. The use of magnetoresistive sensors, especially given the recent development of magnetic tunnel junctions (MTJ) with MgO barriers exhibiting magnetoresistance (MR) values as large as 400%, has created interest in flux concentrators as an avenue to not only increase sensitivity but to also mitigate the 1/f noise that is prevalent in these devices at low frequencies. Here we describe the magnetic modeling that has facilitated the development of the micromechanical system (MEMS) flux concentrator, a device that uses magnetic flux concentrators deposited on MEMS structures that modulate low frequency signals at the position of the sensor, essentially shifting the signal of interest to a frequency range in which 1/f noise is much lower. We present magnetic modeling results of various designs, including our current design, focusing on key design elements.
引用
收藏
页码:182 / 187
页数:6
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