Polarized light scattering in dielectric layers with rough interfaces

被引：3

作者：

Dogariu, M ^{[1
]}

Asakura, T ^{[1
]}

机构：

[1] HOKKAIDO UNIV,RES INST ELECT SCI,SAPPORO,HOKKAIDO 060,JAPAN

来源：

OPTICS COMMUNICATIONS | 1996年 / 131卷 / 1-3期

关键词：

BACKSCATTERING; SURFACES; ANISOTROPY; MEDIA;

D O I：

10.1016/0030-4018(96)00221-0

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

'The polarization behavior of light backscattered from layers with random rough interfaces is investigated in a narrow beam geometry. A simple explanation is given for the appearance of four-fold symmetrical polarization patterns in the geometric-optics limit. Multiple scattering sequences are found to be the origin of the observed polarization behavior. Numerical ray-tracing experiments correctly predict the polarization patterns.

引用

页码：1 / 7

页数：7

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