A new laser system for X-rays flashes sensitivity evaluation

被引:1
作者
Lewis, D [1 ]
Lapuyade, H [1 ]
Deval, Y [1 ]
Maidon, Y [1 ]
Darracq, F [1 ]
Briand, R [1 ]
Fouillat, P [1 ]
机构
[1] Univ Bordeaux 1, IXL, F-33405 Talence, France
来源
SEVENTH IEEE INTERNATIONAL ON-LINE TESTING WORKSHOP, PROCEEDINGS | 2001年
关键词
D O I
10.1109/OLT.2001.937829
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
This paper describes a new methodology using an optical laser bench for ICs X-rays-flashes sensitivity evaluation. Application to the study of one hardening technique of a BandGap Reference circuit is presented.
引用
收藏
页码:111 / 113
页数:3
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