Semiconducting boron carbides with better charge extraction through the addition of pyridine moieties

被引:22
作者
Echeverria, Elena [1 ]
Dong, Bin [2 ]
Peterson, George [3 ]
Silva, Joseph P. [2 ]
Wilson, Ethiyal R. [1 ]
Driver, M. Sky [2 ]
Jun, Young-Si [4 ]
Stucky, Galen D. [4 ]
Knight, Sean [5 ]
Hofmann, Tino [5 ]
Han, Zhong-Kang [6 ,7 ]
Shao, Nan [8 ]
Gao, Yi [6 ,7 ]
Mei, Wai-Ning [8 ]
Nastasi, Michael [3 ,9 ]
Dowben, Peter A. [1 ]
Kelber, Jeffry A. [2 ]
机构
[1] Univ Nebraska Lincoln, Dept Phys & Astron, Jorgensen Hall,855 North 16th St, Lincoln, NE 68588 USA
[2] Univ North Texas, Dept Chem, 232 Sci Res Bldg Ave B & Mulberry St, Denton, TX 76203 USA
[3] Univ Nebraska Lincoln, Dept Mech & Mat Engn, Walter Scott Engn Ctr, Lincoln, NE 68583 USA
[4] Univ Calif Santa Barbara, Dept Chem, Santa Barbara, CA 93106 USA
[5] Univ Nebraska Lincoln, Walter Scott Engn Ctr, Dept Elect & Comp Engn, Lincoln, NE 68588 USA
[6] Chinese Acad Sci, Shanghai Inst Appl Phys, Div Interfacial Water, Shanghai 201800, Peoples R China
[7] Chinese Acad Sci, Shanghai Inst Appl Phys, Key Lab Interfacial Phys & Technol, Shanghai 201800, Peoples R China
[8] Univ Nebraska Omaha, Dept Phys, 60th & Dodge St, Omaha, NE 68182 USA
[9] Univ Nebraska OmahaNebraska Lincoln, Whittier Res Ctr, Nebraska Ctr Energy Sci Res, Lincoln, NE 68583 USA
基金
美国国家科学基金会; 美国国家航空航天局;
关键词
boron carbides; pyridine; PECVD; ellipsometry; NEUTRON-DETECTION; FILMS; IRRADIATION; SILICON; PECVD;
D O I
10.1088/0022-3727/49/35/355302
中图分类号
O59 [应用物理学];
学科分类号
摘要
The plasma-enhanced chemical vapor (PECVD) co-deposition of pyridine and 1,2 dicarbadodecaborane, 1,2-B10C2H12 (orthocarborane) results in semiconducting boron carbide composite films with a significantly better charge extraction than plasma-enhanced chemical vapor deposited semiconducting boron carbide synthesized from orthocarborane alone. The PECVD pyridine/orthocarborane based semiconducting boron carbide composites, with pyridine/orthocarborane ratios similar to 3:1 or 9:1 exhibit indirect band gaps of 1.8 eV or 1.6 eV, respectively. These energies are less than the corresponding exciton energies of 2.0 eV-2.1 eV. The capacitance/voltage and current/voltage measurements indicate the hole carrier lifetimes for PECVD pyridine/orthocarborane based semiconducting boron carbide composites (3:1) films of similar to 350 mu s compared to values of <= 35 mu s for the PECVD semiconducting boron carbide films fabricated without pyridine. The hole carrier lifetime values are significantly longer than the initial exciton decay times in the region of similar to 0.05 ns and 0.27 ns for PECVD semiconducting boron carbide films with and without pyridine, respectively, as suggested by the time-resolved photoluminescence. These data indicate enhanced electron-hole separation and charge carrier lifetimes in PECVD pyridine/orthocarborane based semiconducting boron carbide and are consistent with the results of zero bias neutron voltaic measurements indicating significantly enhanced charge collection efficiency.
引用
收藏
页数:11
相关论文
共 54 条
[1]   Low-field current transport mechanisms in rf magnetron sputter deposited boron carbide (B5C)/p-type crystalline silicon junctions in the dark [J].
Abdul-Gader, MM ;
Al-Binni, UA ;
Ahmad, AA ;
Al-Basha, MA ;
Ianno, NJ .
INTERNATIONAL JOURNAL OF ELECTRONICS, 2001, 88 (08) :873-901
[2]   Semiconducting Boron-rich neutron detectors [J].
Adenwalla, S ;
Billa, R ;
Brand, JI ;
Day, E ;
Diaz, MJ ;
Harken, A ;
McMullen-Gunn, A ;
Padmanabhan, R ;
Robertson, BW .
PENETRATING RADIATION SYSTEMS AND APPLICATIONS V, 2003, 5199 :70-74
[3]   Optical properties of boron carbide (B5C) thin films fabricated by plasma-enhanced chemical-vapor deposition [J].
Ahmad, AA ;
Ianno, NJ ;
Snyder, PG ;
Welipitiya, D ;
Byun, D ;
Dowben, PA .
JOURNAL OF APPLIED PHYSICS, 1996, 79 (11) :8643-8647
[4]   Chemical state quantification of iron and chromium oxides using XPS: the effect of the background subtraction method [J].
Aronniemi, M ;
Sainio, J ;
Lahtinen, J .
SURFACE SCIENCE, 2005, 578 (1-3) :108-123
[5]   Charge carrier lifetime in boron carbide thin films [J].
Bao, Ruqiang ;
Yan, Zijie ;
Chrisey, Douglas B. .
APPLIED PHYSICS LETTERS, 2011, 98 (19)
[6]  
Briggs D., 1990, Practical surface analysis, V2nd
[7]   DEFECT CLUSTERING AND SELF-HEALING OF ELECTRON-IRRADIATED BORON-RICH SOLIDS [J].
CARRARD, M ;
EMIN, D ;
ZUPPIROLI, L .
PHYSICAL REVIEW B, 1995, 51 (17) :11270-11274
[8]   The all boron carbide diode neutron detector: Comparison with theory [J].
Caruso, A. N. ;
Dowben, P. A. ;
Balkir, S. ;
Schemm, Nathan ;
Osberg, Kevin ;
Fairchild, R. W. ;
Flores, Oscar Barrios ;
Balaz, Snjezana ;
Harken, A. D. ;
Robertson, B. W. ;
Brand, J. I. .
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2006, 135 (02) :129-133
[9]   The physics of solid-state neutron detector materials and geometries [J].
Caruso, A. N. .
JOURNAL OF PHYSICS-CONDENSED MATTER, 2010, 22 (44)
[10]   Effect of bias on neutron detection in thin semiconducting boron carbide films [J].
Day, E. ;
Diaz, M. J. ;
Adenwalla, S. .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2006, 39 (14) :2920-2924