Energy distributions of electrons emitted from GaAs(Cs,O)

被引:71
作者
Orlov, DA [1 ]
Hoppe, M
Weigel, U
Schwalm, D
Terekhov, AS
Wolf, A
机构
[1] Max Planck Inst Kernphys, D-69029 Heidelberg, Germany
[2] Russian Acad Sci, Inst Semicond Phys, Novosibirsk 630090, Russia
关键词
D O I
10.1063/1.1368376
中图分类号
O59 [应用物理学];
学科分类号
摘要
A method to map out the energy distribution N(E-parallel to,E-perpendicular to) of an electron beam as a function of the longitudinal (E-parallel to) and transverse (E-perpendicular to) energy has been developed and applied to study the photoemission process from GaAs(Cs, O) at 90 K. The method proceeds by "marking" electrons with fixed longitudinal energy E-parallel to(b) and a subsequent measurement of the associated differential transverse energy distribution N-perpendicular to(E-parallel to(b),E-perpendicular to), applying an adiabatic magnetic compression technique. The complete energy distribution N(E-parallel to,E-perpendicular to) of electrons from a GaAs(Cs, O) photocathode obtained by a stepwise variation of E-parallel to(b) provides details about the transfer of electrons through the GaAs(Cs, O)-vacuum interface and demonstrates that not only electron energy loss, but also elastic electron scattering is of crucial importance in the escape process. (C) 2001 American Institute of Physics.
引用
收藏
页码:2721 / 2723
页数:3
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