X-ray absorption spectroscopy on epitaxial BaTiO3 thin film

被引：1

作者：

Panchal, Gyanendra ^{[1
]}

Shukla, D. K. ^{[1
]}

Choudhary, R. J. ^{[1
]}

Reddy, V. Raghavendra ^{[1
]}

Phase, D. M. ^{[1
]}

机构：

[1] UGC DAE Consortium Sci Res, Univ Campus,Kandhwa Rd, Indore 452001, Madhya Pradesh, India

来源：

61ST DAE-SOLID STATE PHYSICS SYMPOSIUM | 2017年 / 1832卷

关键词：

X-ray diffraction; X-ray absorption spectroscopy; ferroelectrics; FERROELECTRICITY;

D O I：

10.1063/1.4980490

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

We report the soft X-ray absorption spectroscopy (XAS) on pulsed laser deposition (PLD) grown epitaxial BaTiO3 thin film on (001) oriented SrTiO3 substrate. X-ray diffraction studies confirm that film is grown along the [00l] direction and is compressed along surface normal. XAS around O K edge and Ti L-3,L-2 edges performed on BaTiO3 thin film along with bulk BaTiO3 depicts considerable changes in crystal field parameters in thin film form due to strain present in the film. Modifications observed in t(2g) and c(g) sub bands of Ti ions are explained considering structural anisotropies present in the thin film.

引用

页数：3

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