Time-resolved imaging using x-ray free electron lasers

被引:11
|
作者
Barty, Anton [1 ]
机构
[1] Ctr Free Electron Laser Sci, D-22607 Hamburg, Germany
关键词
EXTREME-ULTRAVIOLET; DIFFRACTION; DYNAMICS; RESOLUTION; SPECTROSCOPY; GENERATION; MICROSCOPY;
D O I
10.1088/0953-4075/43/19/194014
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The ultra-intense, ultra-short x-ray pulses provided by x-ray free electron laser (XFEL) sources are ideally suited to time-resolved studies of structural dynamics with spatial resolution from nanometre to atomic length scales and a temporal resolution of 10 fs or less. With enough photons in a single pulse to enable single-shot measurements and short enough pulses to freeze atomic motion, researchers now have a new window into the time evolution ultrafast phenomena that are intrinsically not cyclic in nature. In this paper we recap some of the key time-resolved imaging experiments performed at FLASH and look ahead to a new generation of experiments at higher resolution using a new generation of new XFEL sources that are only just becoming available.
引用
收藏
页数:15
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