Investigation of ceria by combined Raman, UV-vis and X-ray photoelectron spectroscopy

被引:46
|
作者
Nottbohm, Christoph T. [1 ]
Hess, Christian [1 ]
机构
[1] Tech Univ Darmstadt, Eduard Zintl Inst Anorgan & Phys Chem, D-64287 Darmstadt, Germany
关键词
Ceria; Defects; In situ spectroscopy; PROBING DEFECT SITES; CEO2; SURFACE; OXIDE; REDUCTION; OXIDATION; NANOCRYSTALS; HYDROGEN; STATES; XPS;
D O I
10.1016/j.catcom.2012.02.009
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Surface and bulk oxygen vacancy defects in ceria powder samples were investigated by Raman. UV-vis and X-ray photoelectron spectroscopy combined in one experimental setup for the first time. Analysis of surface reduction (defects) is based on changes in Ce3d photoemission lines. For ceria reduced by X-ray exposure UV-vis spectra reveal an electronic transition at around 500 nm. The nature of the defects is specified by the presence of peroxide and hydroxy Raman bands at 832 cm(-1) and 3664 cm(-1). Our results demonstrate the potential of a combined spectroscopic approach for characterization of defects located at the surface and in the bulk of ceria. (C) 2012 Elsevier B.V. All rights reserved.
引用
收藏
页码:39 / 42
页数:4
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