Fundamental parameter based quantification algorithm for confocal nano-X-ray fluorescence analysis

被引：41

作者：

Schoonjans, Tom ^{[1
]}

Silversmit, Geert ^{[1
]}

Vekemans, Bart ^{[1
]}

Schmitz, Sylvia ^{[2
]}

Burghammer, Manfred ^{[3
]}

Riekel, Christian ^{[3
]}

Brenker, Frank E. ^{[2
]}

Vincze, Laszlo ^{[1
]}

机构：

[1] Univ Ghent, Dept Analyt Chem, Xray Microspect & Imaging Res Grp XMI, B-9000 Ghent, Belgium

[2] Goethe Univ Frankfurt, Geosci Inst Mineral, D-60438 Frankfurt, Germany

[3] ESRF, F-38043 Grenoble, France

来源：

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 2012年 / 67卷

关键词：

X-ray fluorescence; Quantification; Confocal; Fundamental parameter method; MONTE-CARLO-SIMULATION; MATTER; ENHANCEMENT; SPECTRA; LIBRARY; SAMPLES; PART;

D O I：

10.1016/j.sab.2011.12.006

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

A new method for the quantification of X-ray fluorescence (XRF) was derived based on the fundamental parameter method (FPM). The FPM equations were adapted to accommodate the special case of confocal nano-XRF, i.e. X-ray nano-beam excitation coupled with confocal detection, taking into account the special characteristics of the detector channel polycapillary. A thorough error estimation algorithm based on the Monte Carlo method was applied, producing a detailed analysis of the uncertainties of the quantification results. The new FPM algorithm was applied on confocal nano-XRF data obtained from cometary dust returned by NASA's Stardust mission, recorded at beamline ID13 of the European Synchrotron Radiation Facility. (C) 2011 Elsevier B.V. All rights reserved.

引用

页码：32 / 42

页数：11

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