Contactless electroreflectance spectroscopy of optical transitions in low dimensional semiconductor structures

被引:28
|
作者
Misiewicz, J. [1 ]
Kudrawiec, R. [1 ]
机构
[1] Wroclaw Univ Technol, Inst Phys, PL-50370 Wroclaw, Poland
关键词
contactless electroreflectance; quantum wells; quantum dots; optical transitions; ELECTRON EFFECTIVE-MASS; MULTIPLE-QUANTUM WELLS; GAAS-BASED STRUCTURES; PHOTOREFLECTANCE SPECTROSCOPY; ELECTROMODULATION SPECTROSCOPY; ALGAN/GAN HETEROSTRUCTURES; MODULATION SPECTROSCOPY; WETTING LAYER; DOT; REFLECTIVITY;
D O I
10.2478/s11772-012-0022-1
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The authors present the application of contactless electroreflectance (CER) spectroscopy to study optical transitions in low dimensional semiconductor structures including quantum wells (QWs), step-like QWs, quantum dots (QDs), quantum dashes (QDashes), QDs and QDashes embedded in a QW, and QDashes coupled with a QW. For QWs optical transitions between the ground and excited states as well as optical transitions in QW barriers and step-like barriers have been clearly observed in CER spectra. Energies of these transitions have been compared with theoretical calculations and in this way the band structure has been determined for the investigated QWs. For QD and QDash structures optical transitions in QDs and QDashes as well as optical transitions in the wetting layer have been identified. For QDs and QDashes surrounded by a QW, in addition to energies of QD and QDash transitions, energies of optical transitions in the surrounded QW have been measured and the band structure has been determined for the surrounded QW. Finally some differences, which can be observed in CER and photo-reflectance spectra, have been presented and discussed for selected QW and QD structures.
引用
收藏
页码:101 / 119
页数:19
相关论文
共 50 条
  • [31] The absorption coefficient of low dimensional semiconductor systems:: the photoluminescence of InGaN quantum dot
    Rodríguez-Coppola, H
    Tutor-Sánchez, J
    Leite, JR
    Scolfaro, LMR
    García-Moliner, F
    MICROELECTRONICS JOURNAL, 2004, 35 (02) : 103 - 110
  • [32] Optical spectroscopy on semiconductor quantum dots in high magnetic fields
    Babinski, Adam
    Potemski, Marek
    Christianen, Peter C. M.
    COMPTES RENDUS PHYSIQUE, 2013, 14 (01) : 121 - 130
  • [33] GaN Low-dimensional Structures
    Dyadenchuk, A. F.
    Kidalov, V. V.
    JOURNAL OF NANO- AND ELECTRONIC PHYSICS, 2014, 6 (04)
  • [34] Characterization of nanometric quantum wells in semiconductor heterostructures by optical spectroscopy
    Laureto, E
    Vasconcellos, AR
    Meneses, EA
    Luzzi, R
    INTERNATIONAL JOURNAL OF MODERN PHYSICS B, 2004, 18 (12): : 1743 - 1758
  • [35] Optical Spectroscopy of Single Semiconductor Nanocrystals Close to Gold Nanoparticles
    Ma, Xuedan
    Tan, Hua
    Kipp, Tobias
    Mews, Alf
    COLLOIDAL NANOCRYSTALS FOR BIOMEDICAL APPLICATIONS VII, 2012, 8232
  • [36] Coherent optical spectroscopy of charged exciton complexes in semiconductor nanostructures
    Akimov, Ilya A.
    Poltavtsev, Sergey V.
    Salewski, Matthias
    Yugova, Irina A.
    Karczewski, Grzegorz
    Wiater, Maciej
    Wojtowicz, Tomasz
    Reichelt, Matthias
    Meier, Torsten
    Yakovlev, Dmitri R.
    Bayer, Manfred
    ULTRAFAST PHENOMENA AND NANOPHOTONICS XXII, 2018, 10530
  • [37] The strain distribution of low-dimensional semiconductor materials
    Zhou, WM
    Wang, CY
    ACTA PHYSICA SINICA, 2004, 53 (12) : 4308 - 4313
  • [38] Direct optical analysis of the carrier diffusion in semiconductor wire structures
    Hubner, B
    Zengerle, R
    Forchel, A
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1995, 35 (1-3): : 273 - 277
  • [39] Nonequilibrium spectroscopy of inter-and intraband transitions in quantum dot structures
    Vorobjev, LE
    Glukhovskoy, AV
    Danilov, SN
    Panevin, VY
    Firsov, DA
    Fedosov, NK
    Shalygin, VA
    Andreev, AD
    Volovik, BV
    Ledentsov, NN
    Livshits, DA
    Ustinov, VM
    Tsatsul'nikov, AF
    Shernyakov, YM
    Grundmann, M
    Weber, A
    Fossard, F
    Julien, FH
    ULTRAFAST PHENOMENA IN SEMICONDUCTORS 2001, 2002, 384-3 : 39 - 42
  • [40] Nondestructive room-temperature characterization of wafer-sized III-V semiconductor device structures using contactless electromodulation and surface photovoltage spectroscopy - Invited paper
    Pollak, FH
    PHYSICS AND SIMULATION OF OPTOELECTRONIC DEVICES VIII, PTS 1 AND 2, 2000, 3944 : 408 - 422