A 106 nW 10 b 80 kS/s SAR ADC With Duty-Cycled Reference Generation in 65 nm CMOS

被引:39
作者
Liu, Maoqiang [1 ]
Pelzers, Kevin [1 ]
van Dommele, Rainier [1 ]
van Roermund, Arthur [1 ]
Harpe, Pieter [1 ]
机构
[1] Eindhoven Univ Technol, Dept Mixed Signal Microelect, Eindhoven, Netherlands
关键词
CMOS; duty-cycle; dynamic comparator; reference voltage generator; SAR ADC;
D O I
10.1109/JSSC.2016.2587688
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a 10 b 80 kS/s SAR ADC with low-power duty-cycled reference generation. It generates a stable reference voltage on chip for the SAR ADC and imparts very good immunity against power supply interference to the ADC. A 0.62 V-VDD 25 nW CMOS reference voltage generator (RVG) is presented, which has only +/-1.5% variation over process corners. A duty-cycling technique is applied to enable 10% duty-cycling of the RVG, resulting in negligible power consumption of the RVG compared to that of the ADC. Furthermore, a bidirectional dynamic preamplifier is adopted in the SAR ADC, which consumes about half the power compared with a regular dynamic structure and maintains noise and gain performance. Compared with prior-art low-power ADCs, this work is the first to integrate the reference generation and include it in the power consumption while maintaining a competitive 2.4 fJ/conversion-step FoM. The chip is fabricated in 65 nm CMOS technology.
引用
收藏
页码:2435 / 2445
页数:11
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