Autocorrelation aided Rough Set Based Contamination Level Prediction of High Voltage Insulator at Different Environmental Condition

被引:24
作者
Banik, A. [1 ]
Dalai, S. [1 ]
Chatterjee, B. [1 ]
机构
[1] Jadavpur Univ, Dept Elect Engn, Kolkata 700032, W Bengal, India
关键词
Leakage current; contamination; rough set theory (RST); autocorrelation technique; solid layer method (SLM); LEAKAGE CURRENT; COMPOSITE INSULATORS; HARMONIC COMPONENTS; DIAGNOSTIC-TOOL;
D O I
10.1109/TDEI.2016.7736849
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a Rough Set Theory (RST) based approach for predicting the surface contamination level of porcelain type insulators at different environmental condition. The sample insulators have been contaminated by Solid layer Method (SLM) according to IEC60507. Leakage current of the insulators are recorded at different contamination level and at different humidity conditions. In the proposed method, autocorrelation technique is used for feature selection from leakage current because it is well suited for non-stationary leakage current signals and cancels out the effect of noise present in the signal. Rough Set Theory is used for classification of extracted features as it suits well with the correlation technique. Result shows that the proposed method is able to detect the contamination level with acceptable range of accuracy.
引用
收藏
页码:2883 / 2891
页数:9
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