Dielectric constant and loss tangent measurement using a stripline fixture

被引：3

作者：

Yue, HP ^{[1
]}

Virga, KL ^{[1
]}

Prince, JL ^{[1
]}

机构：

[1] Univ Arizona, Dept Elect & Comp Engn, Ctr Elect Packaging Res, Tucson, AZ 85721 USA

来源：

IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART B-ADVANCED PACKAGING | 1998年 / 21卷 / 04期

关键词：

characteristic impedance; dielectric constant; dielectric loss tangent; measurement; stripline;

D O I：

10.1109/96.730430

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A new approach to dielectric material characterization with a vector network analyzer is presented. As the characteristic impedance (Z(o)) of a stripline transmission line can be accurately determined by measuring the two-port scattering parameters in the frequency range of interest, the dielectric constant of the insulation material that consists as part of the stripline configuration is then obtained by a relationship to the characteristic impedance. The dielectric loss (or loss tangent) can be determined by measuring the return loss and the insertion loss of the stripline, The validity of the technique is demonstrated for well-characterized dielectric materials such as Teflon-based and other composite laminates. The technique is then applied to integrated circuit (IC) molding compounds as-processed.

引用

页码：441 / 446

页数：6