Identification of the Specification Parameters for a Voltage Controlled Oscillator Using an Artificial Neural Network with a Genetic Algorithm

被引:2
作者
Temich, Sebastian [1 ]
Chruszczyk, Lukas [1 ]
Grzechca, Damian [1 ]
机构
[1] Silesian Tech Univ, Fac Automat Control Elect & Comp Sci, Inst Elect, Akad 16, PL-44100 Gliwice, Poland
关键词
Voltage-controlled oscillator; Specification parameters; Identification; Genetic algorithm; Optimisation; Artificial neural network; ANALOG CIRCUITS; FAULT-DIAGNOSIS; DEFECTS;
D O I
10.5755/j01.eie.24.6.20945
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents the application of an artificial neural network with a genetic algorithm for identifying the selected specification parameters of a voltage-controlled oscillator (VCO). In modern electronics, the complexity of the production process may cause errors in analogue and mixed-signal electronic circuits, and inaccuracies in this technological process have a direct impact on the specification parameters of a VCO. The modern market requires that the production process has to be as quick as possible, and therefore testing systems should be fast and have the highest efficiency of parameter identification. In the following paper, a genetic algorithm is used to optimise the number of output signal measurement points, which allows them to be identified by the specification parameters of the VCO that are selected by an artificial neural network. The proposed method is characterised by shortening the test time of the system while maintaining a high efficiency in the identification of the selected design specification parameters.
引用
收藏
页码:42 / 49
页数:8
相关论文
共 26 条
[1]   Fault diagnosis of analog circuits using Bayesian neural networks with wavelet transform as preprocessor [J].
Aminian, F ;
Aminian, M .
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2001, 17 (01) :29-36
[2]  
Burbidge M., TEST DIAGNOSIS ANALO, P277, DOI [10.1049/pbcs019e_ch9, DOI 10.1049/PBCS019E_CH9]
[3]   Automatic Test Bench for Selected Transmission Parameters of Power Line Conductors [J].
Chruszczyk, Lukasz .
INTERNATIONAL JOURNAL OF ELECTRONICS AND TELECOMMUNICATIONS, 2015, 61 (01) :59-65
[4]  
Gladson S. C., 2016, INT C CIRC POW COMP, P1, DOI [10.1109/ICCPCT.2016.7530171, DOI 10.1109/ICCPCT.2016.7530171]
[5]   Construction of an Expert System Based on Fuzzy Logic for Diagnosis of Analog Electronic Circuits [J].
Grzechca, Damian E. .
INTERNATIONAL JOURNAL OF ELECTRONICS AND TELECOMMUNICATIONS, 2015, 61 (01) :77-82
[6]   Diagnosis of Local Spot Defects in Analog Circuits [J].
Huang, Ke ;
Stratigopoulos, Haralampos-G. ;
Mir, Salvador ;
Hora, Camelia ;
Xing, Yizi ;
Kruseman, Bram .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2012, 61 (10) :2701-2712
[7]   Bayesian Fault Diagnosis of RF Circuits Using Nonparametric Density Estimation [J].
Huang, Ke ;
Stratigopoulos, Haralampos-G. ;
Mir, Salvador .
2010 19TH IEEE ASIAN TEST SYMPOSIUM (ATS 2010), 2010, :295-298
[8]  
Jantos P., 2011, 2011 MIXDES - 18th International Conference "Mixed Design of Integrated Circuits & Systems", P485
[9]  
Kabisatpathy P., 2005, FAULT DIAGNOSIS ANAL, DOI [10.1007/b135977, DOI 10.1007/B135977]
[10]   Design and Analysis of 239 GHz CMOS Push-Push Transformer-Based VCO With High Efficiency and Wide Tuning Range [J].
Koo, Hyunji ;
Kim, Choul-Young ;
Hong, Songcheol .
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2015, 62 (07) :1883-1893